Products Semiconductor testers /
Temperature testing instruments

IC test socket, Test sockets for burn in test / reliability tests / functional test / ROM

Plastronics

IC test socket, Test sockets for burn in test / reliability tests / functional test / ROM
Plastronics provides highly compact and highly efficient packaging sockets. One of their feature products is QFN socket that has over 400 kinds of lineups. Plastronics standard sockets as well as semi-custom sockets are used in a wide range of testing from burn-in to functional tests.
  • Standard socket / Semi custom socket / Full custom socket
  • Socket type：Clam shell socket / Open top socket / Socket and lid
  • Application PKG：BGA, CSP, WLCSP,QFN, DR-QFN, SON, LGA, LCC, etc
IC test socket, Test sockets for functional test / failure analysis / burn-in test / reliability tests

Contech Solutions

IC test socket, Test sockets for functional test / failure analysis / burn-in test / reliability tests
Contech Solutions Inc is a leader in design and manufacturing of Semi-conductor test interface products and Medical Subcontract Manufacturing. At Contech Solutions we are committed to quality, customer satisfaction and delivery of superior products.
  • Semi custom sockets / Full custom socket
  • High frequency test, High digital, High power and high current test, Kelvin test, Strip and multi test, Failure analysis, ATE and HVM test
  • Application PKG：BGA, WLCSP, QFN, SON, LGA, LCC, SOP, QFP, MCM, etc
IC Test socket for High frequency/ High speed digital/ High current devices

Phoenix Test Arrays

IC Test socket for High frequency/ High speed digital/ High current devices
Phoenix Test Arrays offers custom socket designs and integrated test solutions from hand test characterization to high volume ATE production.
Silmat® Contact Systems use extremely short electrical paths to deliver industry leading signal integrity and current carrying capacity to meet the demanding requirements of RF/microwave, precision analog and mixed signal devices. Innovative features and durable components enable reliable and consistent results in challenging test environments
  • Target Packages: PoP, BGA, CSP, WLCSP, QFN, SON, DFN, LGA and others
  • Frequency range: More than 40 GHz Suitable for Lab Test and ATE HVM solution Best for function test of 80GHz-Milliwave radar and sensor , ADAS device applications
Integrated Precision solutions for Testing IC devices over Temperature *Options

MECHANICAL DEVICES

Integrated Precision solutions for Testing IC devices over Temperature *Options
FlexTC provides a reliable self-contained system that is compact and extremely economical to own and operate. The system requires a 10A wall outlet and clean dry air or nitrogen for frost and humidity free operation. For additional flexibility the system can be controlled remotely through the Ethernet communication port.
Standard model Temperature range Size Weight AC input
FlexTC －50～ +150℃ 42 x32 x22cm 22Kg 100V
MaxTC －65～ +175℃ 62 x48 x36cm 55Kg 200V

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